Aberration-corrected analytical transmission electron microscopy /
"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration...
Κύριος συγγραφέας: | Brydson, Rik (Επιμελητής έκδοσης) |
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Μορφή: | Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Chichester, West Sussex :
RMS-Wiley,
2011.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
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Transmission electron microscopy in micro-nanoelectronics /
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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 /
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Low voltage electron microscopy : principles and applications /
Έκδοση: (2013) -
Scanning probe microscopy of soft matter : fundamentals and practices.
ανά: T︠S︡ukruk, V. V. (Vladimir Vasilʹevich)
Έκδοση: (2011) -
Correlative light and electron microscopy /
Έκδοση: (2012)