Aberration-corrected analytical transmission electron microscopy /

• Κύριος συγγραφέας: Brydson, Rik (Επιμελητής έκδοσης)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Chichester, West Sussex : RMS-Wiley, 2011.
• Θέματα: Transmission electron microscopy.; Aberration.; Achromatism.; SCIENCE > Optics.; SCIENCE > Electron Microscopes & Microscopy.; Electronic books.

"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration...

Πίνακας περιεχομένων:

• General Introduction to Transmission Electron Microscopy (TEM) / Peter Goodhew
• Introduction to Electron Optics / Gordon Tatlock
• Development of STEM / L M Brown
• Lens Aberrations: Diagnosis and Correction / Andrew Bleloch, Quentin Ramasse
• Theory and Simulations of STEM Imaging / Peter D Nellist
• Details of STEM / Alan Craven
• Electron Energy Loss Spectrometry and Energy Dispersive X-ray Analysis / Rik Brydson, Nicole Hondow
• Applications of Aberration-Corrected Scanning Transmission Electron Microscopy / Mervyn D Shannon
• Aberration-Corrected Imaging in CTEM / Sarah J Haigh, Angus I Kirkland
• Appendix A: Aberration Notation
• Appendix B: General Notation.