Advances in imaging and electron physics. Volume 160 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Hawkes, P. W.
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam, the Netherlands : Academic Press, an imprint of Elsevier, 2010.
Έκδοση:1st ed.
Σειρά:Advances in imaging and electron physics, v. 160
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 0 0 |a Advances in imaging and electron physics.  |n Volume 160 /  |c edited by Peter W. Hawkes. 
250 |a 1st ed. 
260 |a Amsterdam, the Netherlands :  |b Academic Press, an imprint of Elsevier,  |c 2010. 
300 |a 1 online resource (xx, 296 pages, [4] pages of plates) :  |b illustrations (some color), maps. 
336 |a text  |b txt  |2 rdacontent 
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490 0 |a Advances in imaging and electron physics,  |x 1076-5670 ;  |v v. 160 
504 |a Includes bibliographical references and index. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
588 0 |a Print version record. 
650 0 |a Electrons. 
650 0 |a Electronics. 
650 0 |a Imaging systems. 
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655 4 |a Electronic books. 
700 1 |a Hawkes, P. W. 
776 0 8 |i Print version:  |t Advances in imaging and electron physics. Volume 160.  |d Amsterdam ; Boston, Mass. : Academic Press, ©2010  |z 9780123810175  |w (OCoLC)489631527 
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