Optics of charged particle analyzers /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Άλλοι συγγραφείς: Hawkes, P. W.
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam : Academic Press/Elsevier, 2011.
Έκδοση:1st ed.
Σειρά:Advances in imaging and electron physics ; v. 168.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 0 0 |a Optics of charged particle analyzers /  |c edited by Peter W. Hawkes. 
250 |a 1st ed. 
260 |a Amsterdam :  |b Academic Press/Elsevier,  |c 2011. 
300 |a 1 online resource (xv, 373 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Advances in imaging and electron physics,  |x 1076-5670 ;  |v v. 168 
504 |a Includes bibliographical references and index. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
650 0 |a Optoelectronic devices. 
650 0 |a Optical data processing. 
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650 7 |a Optoelectronic devices.  |2 fast  |0 (OCoLC)fst01046908 
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776 0 8 |i Print version:  |z 9786613209566 
830 0 |a Advances in imaging and electron physics ;  |v v. 168. 
856 4 0 |u https://www.sciencedirect.com/science/bookseries/10765670/168  |z Full Text via HEAL-Link