X-ray photoelectron spectroscopy : an introduction to principles and practices /

• Κύριος συγγραφέας: Van der Heide, Paul, 1962-
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Hoboken, N.J. : Wiley-Blackwell, [2012]
• Θέματα: X-ray photoelectron spectroscopy.; Photoelectron Spectroscopy.; SCIENCE > Spectroscopy & Spectrum Analysis.; Electronic books.

 "This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections"--   Provided by publisher. 

 Frontmatter -- Introduction -- Atoms, Ions, and their Electronic Structure -- XPS Instrumentation -- Data Collection and Quantification -- Spectral Interpretation -- Some Case Studies -- Appendices. Appendix A: Periodic Table of the Elements -- Appendix B: Binding Energies (or) of the Elements -- Appendix C: Some Quantum Mechanics Calculations of Interest -- Appendix D: Some Statistical Distributions of Interest -- Appendix E: Some Optical Properties of Interest -- Appendix F: Some other Spectroscopic/Spectrometric Techniques of Interest -- Appendix G: Some Microscopies of Interest -- Appendix H: Some Reflection/Diffraction Techniques of Interest -- Technique Abbreviations List -- Instrument-Based Abbreviations -- Glossary of Terms -- Questions and Answers -- XPS Vendors -- References -- Index.