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02824nam a2200697 4500 |
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ocn771282798 |
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OCoLC |
| 005 |
20170124071433.4 |
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m o d |
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cr |n||||||||| |
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110819s2011 gw fob 001 0 eng d |
| 040 |
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|a CDX
|b eng
|e pn
|c CDX
|d OCLCQ
|d YDXCP
|d E7B
|d MBB
|d OCLCO
|d DEBSZ
|d OCLCQ
|d DG1
|d N$T
|d EBLCP
|d COO
|d OCLCF
|d IDEBK
|d DEBBG
|d OCLCQ
|d OCL
|d OCLCQ
|d AZK
|d LOA
|d GrThAP
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| 019 |
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|a 773301844
|a 778459392
|a 778618921
|a 816879809
|a 961536094
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| 020 |
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|a 9783527410668
|q (Cloth)
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|a 9786613379498
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|a (OCoLC)771282798
|z (OCoLC)773301844
|z (OCoLC)778459392
|z (OCoLC)778618921
|z (OCoLC)816879809
|z (OCoLC)961536094
|z (OCoLC)962593953
|z (OCoLC)966214996
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|b MIL
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0 |
4 |
|a 621.3/8152
|2 23
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| 049 |
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|a MAIN
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| 245 |
0 |
0 |
|a Mechanical stress on the nanoscale :
|b simulation, material systems and characterization techniques /
|c edited by Margrit Hanbücken, Pierre Muller, Ralf B. Wehrspohn.
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| 264 |
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|a Weinheim :
|b Wiley-VCH,
|c 2011.
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| 300 |
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|a 1 online resource (380 pages)
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a data file
|2 rda
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| 588 |
0 |
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|a Print version record.
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| 505 |
0 |
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|a pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Semiconductors
|x Defects.
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| 650 |
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0 |
|a Semiconductors
|x Reliability.
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| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Material Science.
|2 bisacsh
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| 650 |
|
7 |
|a Semiconductors
|x Defects.
|2 fast
|0 (OCoLC)fst01112211
|
| 650 |
|
7 |
|a Semiconductors
|x Reliability.
|2 fast
|0 (OCoLC)fst01112249
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| 655 |
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4 |
|a Electronic books.
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| 655 |
|
7 |
|a Electronic books.
|2 local
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| 700 |
1 |
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|a Hanbücken, Margrit.
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| 700 |
1 |
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|a Muller, Pierre,
|d 1950-
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| 700 |
1 |
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|a Wehrspohn, Ralf B.
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| 776 |
0 |
8 |
|i Print version:
|z 9786613379498
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| 856 |
4 |
0 |
|u https://doi.org/10.1002/9783527639540
|z Full Text via HEAL-Link
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| 994 |
|
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|a 92
|b DG1
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