Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

Bibliographic Details
Other Authors: Hanbücken, Margrit, Muller, Pierre, 1950-, Wehrspohn, Ralf B.
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, 2011.
Subjects:
Semiconductors > Defects.
Semiconductors > Reliability.
TECHNOLOGY & ENGINEERING > Material Science.
Electronic books.
Online Access:Full Text via HEAL-Link

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