Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

• Other Authors: Hanbücken, Margrit, Muller, Pierre, 1950-, Wehrspohn, Ralf B.
• Format: eBook
• Language: English
• Published: Weinheim : Wiley-VCH, 2011.
• Subjects: Semiconductors > Defects.; Semiconductors > Reliability.; TECHNOLOGY & ENGINEERING > Material Science.; Electronic books.

Table of Contents:

• pt. 1. Fundamentals of stress and strain on the nanoscale
• pt. 2. Model systems with stress-engineered properties
• pt. 3. Characterization techniques of measuring stresses on the nanoscale.