Advances in imaging and electron physics. Volume 170.

• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Oxford : Academic, 2012.
• Θέματα: Optoelectronic devices.; Optical data processing.; Electronic books.

 Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 

 Precession Electron Diffraction / A.S. Eggeman and P.A. Midgley -- Scanning Helium Ion Microscopy / R. Hill, J.A. Notte, and L. Scipioni -- Signal reconstruction algorithm based on a single intensity in the Fresnel domain / Hone-Ene Hwang, Pin Han -- Electron Microscopy Studies on Magnetic L10 FePd Nanoparticles / Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu -- Fundamental aspects of Near Field Emission Scanning Electron Microscopy / D.A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J.P. Xanthakis.