Scanning probe microscopy of soft matter : fundamentals and practices.

• Κύριος συγγραφέας: T︠S︡ukruk, V. V. (Vladimir Vasilʹevich) (Συγγραφέας)
• Άλλοι συγγραφείς: Singamaneni, Srikanth
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Weinheim : Wiley, 2011.
• Θέματα: Scanning probe microscopy.; Materials science.; Electron microscopy > Computer simulation.; Soft condensed matter.; SCIENCE > Electron Microscopes & Microscopy.; Electronic books.

 Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:> 

 Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices; Contents; Preface; Part One: Microscopy Fundamentals; 1 Introduction; References; 2 Scanning Probe Microscopy Basics; 2.1 Basic Principles of Scanning Probe Microscopy; 2.2 Scanning Tunneling Microscopy; 2.3 Advent of Atomic Force Microscopy; 2.4 Overview of Instrumentation; 2.4.1 Scanners; 2.4.2 Microcantilevers as Force Sensors; 2.4.3 Electronic Feedback; 2.5 Probes and Cantilevers in Scanning Probe Microscopy; 2.5.1 Physical Attributes of Microcantilevers; 2.5.2 Tip Characterization; 2.5.3 Tip Modification.