Neutron and x-ray microscopy. Part 1 /

• Άλλοι συγγραφείς: Cremer, Jay Theodore, Jr
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Amsterdam ; Boston : Elsevier/Academic Press, 2012.
• Έκδοση: 1st ed.
• Σειρά: Advances in imaging and electron physics ; v. 172.
• Θέματα: X-ray microscopy.; SCIENCE > Microscopes & Microscopy.; Electronic books.
• Περιγραφή τεκμηρίου: Title from PDF title page (viewed on July 27, 2012).
• Φυσική περιγραφή: 1 online resource.
• Βιβλιογραφία: Includes bibliographical references and index.
• ISBN: 9780123978141; 0123978149; 9780123944221; 0123944228

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.