Neutron and x-ray microscopy. Part 1 /
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide...
Άλλοι συγγραφείς: | Cremer, Jay Theodore, Jr |
---|---|
Μορφή: | Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Amsterdam ; Boston :
Elsevier/Academic Press,
2012.
|
Έκδοση: | 1st ed. |
Σειρά: | Advances in imaging and electron physics ;
v. 172. |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 /
Έκδοση: (1999) -
Low voltage electron microscopy : principles and applications /
Έκδοση: (2013) -
Aberration-corrected analytical transmission electron microscopy /
ανά: Brydson, Rik
Έκδοση: (2011) -
Scanning probe microscopy of soft matter : fundamentals and practices.
ανά: T︠S︡ukruk, V. V. (Vladimir Vasilʹevich)
Έκδοση: (2011) -
Correlative light and electron microscopy /
Έκδοση: (2012)