APA (7th ed.) Citation

Haugstad, G. (2012). Atomic force microscopy: Exploring basic modes and advanced applications. John Wiley & Sons. https://doi.org/10.1002/9781118360668

Chicago Style (17th ed.) Citation

Haugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. Hoboken, N.J.: John Wiley & Sons, 2012. https://doi.org/10.1002/9781118360668.

MLA (8th ed.) Citation

Haugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. John Wiley & Sons, 2012. https://doi.org/10.1002/9781118360668.