Atomic force microscopy : exploring basic modes and advanced applications /
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| Format: | eBook |
| Language: | English |
| Published: |
Hoboken, N.J. :
John Wiley & Sons,
[2012]
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| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
| Physical Description: | 1 online resource |
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| Bibliography: | Includes bibliographical references. |
| ISBN: | 9781118360668 1118360664 |
| DOI: | 10.1002/9781118360668 |
