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01803nam a2200505 4500 |
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ocn810936286 |
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OCoLC |
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20170124071647.7 |
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m o d |
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cr un||||||||| |
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120924s2012 nju ob 000 0 eng d |
040 |
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|a UIU
|b eng
|e pn
|c UIU
|d E7B
|d DG1
|d UIU
|d DG1
|d OCLCF
|d OCLCQ
|d AZK
|d GrThAP
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|a 961531647
|a 962709879
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|a 9781118360668
|q (electronic bk.)
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|a 1118360664
|q (electronic bk.)
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|z 9780470638828
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|z 0470638826
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1 |
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|a AU@
|b 000050066052
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1 |
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|a CHBIS
|b 009914395
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1 |
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|a CHVBK
|b 193006073
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1 |
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|a DEBBG
|b BV041828993
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1 |
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|a DKDLA
|b 820120-katalog:000599972
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1 |
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|a NZ1
|b 14976716
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|a (OCoLC)810936286
|z (OCoLC)961531647
|z (OCoLC)962709879
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050 |
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4 |
|a QH212.A78
|b H38 2012
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082 |
0 |
4 |
|a 620/.5
|2 23
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|a MAIN
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100 |
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|a Haugstad, Greg,
|d 1963-
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1 |
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|a Atomic force microscopy :
|b exploring basic modes and advanced applications /
|c Greg Haugstad.
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|a Hoboken, N.J. :
|b John Wiley & Sons,
|c [2012]
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264 |
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4 |
|c ©2012
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300 |
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|a 1 online resource
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336 |
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|a text
|b txt
|2 rdacontent
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337 |
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|a computer
|b c
|2 rdamedia
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338 |
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|a online resource
|b cr
|2 rdacarrier
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347 |
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|a data file
|2 rda
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380 |
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|a Bibliography
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504 |
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|a Includes bibliographical references.
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588 |
0 |
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|a Print version record.
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650 |
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0 |
|a Atomic force microscopy.
|
650 |
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7 |
|a Atomic force microscopy.
|2 fast
|0 (OCoLC)fst00820609
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655 |
|
4 |
|a Electronic books.
|
776 |
0 |
8 |
|i Print version:
|a Haugstad, Greg, 1963-
|t Atomic force microscopy.
|d Hoboken, N.J. : John Wiley & Sons, ©2012
|z 9780470638828
|w (DLC) 2012003429
|w (OCoLC)682892479
|
856 |
4 |
0 |
|u https://doi.org/10.1002/9781118360668
|z Full Text via HEAL-Link
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994 |
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|a 92
|b DG1
|