Atomic force microscopy : exploring basic modes and advanced applications /

Atomic force microscopy : exploring basic modes and advanced applications /

Bibliographic Details
Main Author:	Haugstad, Greg, 1963-
Format:	eBook
Language:	English
Published:	Hoboken, N.J. : John Wiley & Sons, [2012]
Subjects:	Atomic force microscopy. Electronic books.
Online Access:	Full Text via HEAL-Link

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