Silicon-based millimeter-wave technology measurement, modeling and applications /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Άλλοι συγγραφείς: | |
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| Μορφή: | Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Amsterdam :
Elsevier/Academic Press,
2012.
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| Σειρά: | Advances in imaging and electron physics ;
v. 174. |
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
| Περίληψη: | Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: Contributions from leading authorities. Informs and updates on all the latest developments in the field. |
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| Φυσική περιγραφή: | 1 online resource (xx, 483 pages) : illustrations. |
| Βιβλιογραφία: | Includes bibliographical references and index. |
| ISBN: | 9780123946362 0123946360 9780123942982 |
