Silicon-based millimeter-wave technology measurement, modeling and applications /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Άλλοι συγγραφείς: | |
|---|---|
| Μορφή: | Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Amsterdam :
Elsevier/Academic Press,
2012.
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| Σειρά: | Advances in imaging and electron physics ;
v. 174. |
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
