|
|
|
|
| LEADER |
03730nam a2200625 4500 |
| 001 |
ocn825819485 |
| 003 |
OCoLC |
| 005 |
20170124071747.9 |
| 006 |
m o d |
| 007 |
cr cnu|||unuuu |
| 008 |
130129s2013 njua ob 001 0 eng d |
| 040 |
|
|
|a DG1
|b eng
|e pn
|c DG1
|d YDXCP
|d E7B
|d NOC
|d OCLCF
|d OCLCO
|d RECBK
|d COO
|d EBLCP
|d DEBSZ
|d REB
|d OCLCQ
|d GrThAP
|
| 019 |
|
|
|a 828299083
|a 876283147
|
| 020 |
|
|
|a 9781118498514
|q (electronic bk.)
|
| 020 |
|
|
|a 1118498518
|q (electronic bk.)
|
| 020 |
|
|
|a 9781118498507
|q (e-book)
|
| 020 |
|
|
|a 111849850X
|q (e-book)
|
| 020 |
|
|
|a 9781118498484
|
| 020 |
|
|
|a 1118498488
|
| 020 |
|
|
|z 9781119971115
|q (hardback)
|
| 029 |
1 |
|
|a AU@
|b 000050562534
|
| 029 |
1 |
|
|a DEBSZ
|b 397475055
|
| 029 |
1 |
|
|a DEBSZ
|b 42588564X
|
| 029 |
1 |
|
|a DEBSZ
|b 431331146
|
| 029 |
1 |
|
|a DEBSZ
|b 449344746
|
| 029 |
1 |
|
|a NLGGC
|b 389626104
|
| 029 |
1 |
|
|a NZ1
|b 15340422
|
| 029 |
1 |
|
|a DEBBG
|b BV043395330
|
| 035 |
|
|
|a (OCoLC)825819485
|z (OCoLC)828299083
|z (OCoLC)876283147
|
| 037 |
|
|
|b 00028608
|
| 050 |
|
4 |
|a QH212.E4
|b L69 2013
|
| 082 |
0 |
4 |
|a 502.8/25
|2 23
|
| 049 |
|
|
|a MAIN
|
| 245 |
0 |
0 |
|a Low voltage electron microscopy :
|b principles and applications /
|c edited by David C. Bell, Natasha Erdman.
|
| 264 |
|
1 |
|a Hoboken :
|b John Wiley & Sons Inc.,
|c 2013.
|
| 300 |
|
|
|a 1 online resource :
|b illustrations.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
|
|a Royal microscopical society-Wiley series
|
| 505 |
0 |
|
|a Introduction to the Theory and Advantages of Low Voltage Electron Microscopy / David C Bell, Natasha Erdman -- SEM Instrumentation Developments for Low kV Imaging and Microanalysis / Natasha Erdman, David C Bell -- Extreme High-Resolution (XHR) SEM Using a Beam Monochromator / Richard J Young, Gerard N A van Veen, Alexander Henstra, Lubomir Tuma -- The Application of Low-Voltage SEM : From Nanotechnology to Biological Research / Natasha Erdman, David C Bell -- Low Voltage High-Resolution Transmission Electron Microscopy / David C Bell -- Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits / Ondrej L Krivanek, Wu Zhou, Matthew F Chisholm, Juan Carlos Idrobo, Tracy C Lovejoy, Quentin M Ramasse, Niklas Dellby -- Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces / Robert Klie -- What's Next? The Future Directions in Low Voltage Electron Microscopy / David C Bell, Natasha Erdman.
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 588 |
0 |
|
|a Print version record.
|
| 520 |
|
|
|a "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--
|c Provided by publisher.
|
| 650 |
|
0 |
|a Electron microscopy
|x Technique.
|
| 650 |
|
4 |
|a Electron microscopy
|x Technique.
|
| 650 |
|
4 |
|a SCIENCE
|x Microscopes & Microscopy.
|
| 650 |
|
7 |
|a Electron microscopy
|x Technique.
|2 fast
|0 (OCoLC)fst00906689
|
| 655 |
|
4 |
|a Electronic books.
|
| 700 |
1 |
|
|a Bell, D. C.
|q (David C.)
|
| 700 |
1 |
|
|a Erdman, Natasha.
|
| 776 |
0 |
8 |
|i Print version:
|t Low voltage electron microscopy.
|d Hoboken : John Wiley & Sons, Inc., 2012
|z 9781119971115
|w (OCoLC)814389516
|
| 830 |
|
0 |
|a RMS-Wiley series.
|
| 856 |
4 |
0 |
|u https://doi.org/10.1002/9781118498514
|z Full Text via HEAL-Link
|
| 994 |
|
|
|a 92
|b DG1
|
