Transmission electron microscopy in micro-nanoelectronics /
Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in indust...
Άλλοι συγγραφείς: | Claverie, A. (Alain) |
---|---|
Μορφή: | Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
London :
ISTE, Ltd. ;
[2013]
Hoboken : Wiley, [2013] |
Σειρά: | ISTE.
|
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Aberration-corrected analytical transmission electron microscopy /
ανά: Brydson, Rik
Έκδοση: (2011) -
Beyond-CMOS nanodevices 2 /
Έκδοση: (2014) -
Beyond-CMOS Nanodevices 1 /
Έκδοση: (2014) -
Quantum Efficiency in Complex Systems.
Έκδοση: (2010) -
Diagnostic electron microscopy a practical guide to tissue preparation and interpretation /
Έκδοση: (2013)