Transmission electron microscopy in micro-nanoelectronics /

• Άλλοι συγγραφείς: Claverie, A. (Alain)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: London : ISTE, Ltd. ; [2013]; Hoboken : Wiley, [2013]
• Σειρά: ISTE.
• Θέματα: Transmission electron microscopy.; Semiconductors.; Micro-nanoelectronics.; Nanoparticles.; Nanotechnology.; Nanoelectronics > Microscopy.; TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.; TECHNOLOGY & ENGINEERING > Electronics > Solid State.; Nanoelectronics / Microscopy.; Electronic books.

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in indust...