Voldman, S. H. (2013). Electrical overstress (EOS): Devices, circuits, and systems. John Wiley & Sons Inc.. https://doi.org/10.1002/9781118703328
Chicago Style (17th ed.) CitationVoldman, Steven H. Electrical Overstress (EOS): Devices, Circuits, and Systems. Chichester, West Sussex, United Kingdom: John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118703328.
MLA (8th ed.) CitationVoldman, Steven H. Electrical Overstress (EOS): Devices, Circuits, and Systems. John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118703328.
Warning: These citations may not always be 100% accurate.