Electrical overstress (EOS) : devices, circuits, and systems /

• Κύριος συγγραφέας: Voldman, Steven H.
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013.
• Σειρά: ESD series.
• Θέματα: Semiconductors > Failures.; Semiconductors > Protection.; Transients (Electricity); Overvoltage.; TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.; Electronic books.

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...