Electrical overstress (EOS) : devices, circuits, and systems /

• Main Author: Voldman, Steven H.
• Format: eBook
• Language: English
• Published: Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013.
• Series: ESD series.
• Subjects: Semiconductors > Failures.; Semiconductors > Protection.; Transients (Electricity); Overvoltage.; TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.; Electronic books.

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...