Advances in imaging and electron physics. Vol. 178 /
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy...
| Άλλοι συγγραφείς: | |
|---|---|
| Μορφή: | Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Amsterdam ; Boston :
Academic Press,
2013.
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| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Front Cover; EDITOR-IN-CHIEF; ADVANCES IN IMAGING ANDELECTRON PHYSICS; COPYRIGHT; CONTENTS; PREFACE; FUTURE CONTRIBUTIONS; CONTRIBUTORS; Chapter One
- Generalized Axiomatic Scale-Space Theory; 1. INTRODUCTION; 2. IMAGE MEASUREMENTS AND THE NOTION OF SCALE; 3. STRUCTURAL ASSUMPTIONS OF SCALE-SPACE THEORY; 4. SCALE-SPACE AXIOMS FOR SPATIAL IMAGE DOMAINS; 5. SCALE-SPACE CONCEPTS FOR SPATIAL IMAGE DOMAINS; 6. SCALE-SPACE AXIOMS FOR SPATIOTEMPORAL IMAGE DOMAINS; 7. SCALE-SPACE CONCEPTS FOR SPATIOTEMPORAL IMAGE DOMAINS; 8. TEMPORAL SMOOTHING KERNELS; 9. HISTORY OF AXIOMATIC SCALE-SPACE FORMULATIONS.
- 10. SUMMARY AND CONCLUSIONSACKNOWLEDGMENTS; REFERENCES; Chapter Two
- Smoothlet Transform: Theory and Applications; 1. INTRODUCTION; 2. SMOOTHLETS; 3. SMOOTHLET TRANSFORM; 4. IMAGE COMPRESSION; 5. IMAGE DENOISING; 6. SUMMARY; REFERENCES; Chapter Three- Theory and Computation of Electron Mirrors: The Central Particle Method; 1. INTRODUCTION; 2. SYSTEMS WITH A STRAIGHT OPTICAL AXIS; 3. AXIALLY SYMMETRIC CHARGED-PARTICLE OPTICAL SYSTEMS; 4. TIME-OF-FLIGHT MASS SPECTROMETER; 5. ELECTRON MICROSCOPE OBJECTIVE WITH AN ELECTRON MIRROR; 6. SUMMARY AND CONCLUSIONS; ACKNOWLEDGMENTS; REFERENCES; INDEX; Volume 1511.
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