Materials characterization : introduction to microscopic and spectroscopic methods /

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Leng, Y. (Yang) (Συγγραφέας)
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Weinheim, Germany : Wiley-VCH, [2013]
Έκδοση:Second edition.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
Φυσική περιγραφή:1 online resource (xiv, 376 pages) : illustrations
Βιβλιογραφία:Includes bibliographical references and index.
ISBN:9783527670772
3527670777
9783527670802
3527670807
9783527670796
3527670793
9783527670789
3527670785
9780470822982
0470822988
DOI:10.1002/9783527670772