Materials characterization : introduction to microscopic and spectroscopic methods /

• Κύριος συγγραφέας: Leng, Y. (Yang) (Συγγραφέας)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Weinheim, Germany : Wiley-VCH, [2013]
• Έκδοση: Second edition.
• Θέματα: Materials.; Materials > Analysis.; TECHNOLOGY & ENGINEERING > Engineering (General); TECHNOLOGY & ENGINEERING > Reference.; Werkstoffprüfung; Mikrostruktur; Mikroskopie; Spektroskopie; Thermoanalyse; Electronic books.

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of...

Πίνακας περιεχομένων:

• Light Microscopy
• X-Ray Diffraction Methods
• Transmission Electron Microscopy
• Scanning Electron Microscopy
• Scanning Probe Microscopy
• X-Ray Spectroscopy for Elemental Analysis
• Electron Spectroscopy for Surface Analysis
• Secondary Ion Mass Spectrometry for Surface Analysis
• Vibrational Spectroscopy for Molecular Analysis
• Thermal Analysis.