Materials characterization : introduction to microscopic and spectroscopic methods /

• Main Author: Leng, Y. (Yang) (Author)
• Format: eBook
• Language: English
• Published: Weinheim, Germany : Wiley-VCH, [2013]
• Edition: Second edition.
• Subjects: Materials.; Materials > Analysis.; TECHNOLOGY & ENGINEERING > Engineering (General); TECHNOLOGY & ENGINEERING > Reference.; Werkstoffprüfung; Mikrostruktur; Mikroskopie; Spektroskopie; Thermoanalyse; Electronic books.

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of...

Table of Contents:

• Light Microscopy
• X-Ray Diffraction Methods
• Transmission Electron Microscopy
• Scanning Electron Microscopy
• Scanning Probe Microscopy
• X-Ray Spectroscopy for Elemental Analysis
• Electron Spectroscopy for Surface Analysis
• Secondary Ion Mass Spectrometry for Surface Analysis
• Vibrational Spectroscopy for Molecular Analysis
• Thermal Analysis.