ESD. Circuits and devices /

• Main Author: Voldman, Steven H. (Author)
• Format: eBook
• Language: English
• Published: Chichester, United Kingdom ; Hoboken, NJ : John Wiley & Sons, Ltd, 2015.
• Edition: Second edition.
• Subjects: Semiconductors > Protection.; Analog integrated circuits > Protection.; Analog integrated circuits > Design and construction.; Electrostatics.; Static eliminators.; TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.; Electronic books.
• Physical Description: 1 online resource.
• Bibliography: Includes bibliographical references and index.
• ISBN: 9781118954485 (epub); 1118954483 (epub); 9781118954478 (pdf); 1118954475 (pdf); 9781118954492; 1118954491; 1118954467; 9781118954461
• DOI: 10.1002/9781118954492

ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protection from electrostatic discharge (ESD), electrical overstress (EOS), and latchup phenomena from a generalist perspective and design synthesis practices providing optimum solutions in advanced technologies. New features in the 2nd edition: -Expanded treatment of ESD and analog design of passive devices of resistors, capacitors, inductors, and active devices of diodes, bipolar junction transistors, MOSFETs, and FINFETs. -Increased focus on ESD power clamps for power rails for CMOS, Bipolar, and BiCMOS. -Co-synthesizing of semiconductor chip architecture and floor planning with ESD design practices for analog, and mixed signal applications -Illustrates the influence of analog design practices on ESD design circuitry, from integration, synthesis and layout, to symmetry, matching, inter-digitation, and common centroid techniques. -Increased emphasis on system-level testing conforming to IEC 61000-4-2 and IEC 61000-4-5. -Improved coverage of low-capacitance ESD, scaling of devices and oxide scaling challenges. ESD: Circuits and Devices 2nd Edition is an essential reference to ESD, circuit & semiconductor engineers and quality, reliability &analysis engineers. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, microelectronics and IC design.