Advances in imaging and electron physics. Volume one hundred and ninety three /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Hawkes, Peter W. (Επιμελητής έκδοσης)
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam [Netherlands] : Academic Press, 2016.
Έκδοση:First edition.
Σειρά:Advances in Imaging and Electron Physics, Volume 193
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Machine generated contents note: 1. Utilizing the Eigen-Emittance Concept for Bright Electron Beams / Alex J. Dragt
  • 1. Introduction
  • 2. Theory
  • 3. Construction of Initial Distributions
  • 4. Applications to Bright Electron Beams
  • 5. Summary and Discussion
  • References
  • 2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers / Igor Spivak-Lavrov
  • 1. Introduction
  • 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties
  • 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones
  • 4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers
  • 5. Summary and Conclusions.