Advances in imaging and electron physics. Volume 200 /

Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, features extended articles on the physics of electron devices (especially semicondu...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Hawkes, P. W. (Επιμελητής έκδοσης)
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam : Academic Press, 2017.
Σειρά:Advances in Imaging and Electron Physics ; Volume 200
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 05443nam a2200529 4500
001 ocn989061364
003 OCoLC
005 20180501122036.0
006 m o d
007 cr |||||||||||
008 170222s2017 ne o 000 0 eng d
040 |a NLE  |b eng  |e rda  |e pn  |c NLE  |d OCLCO  |d YDX  |d N$T  |d OPELS  |d IDEBK  |d EBLCP  |d OCLCF  |d OCLCQ  |d OTZ  |d OCLCQ  |d D6H  |d GrThAP 
019 |a 980172503  |a 980429864  |a 980657188  |a 981048666  |a 981140376  |a 988383295  |a 993674969 
020 |a 9780128121931  |q (ePub ebook) 
020 |a 0128121939  |q (ePub ebook) 
020 |a 9780128120903  |q (hbk.) 
035 |a (OCoLC)989061364  |z (OCoLC)980172503  |z (OCoLC)980429864  |z (OCoLC)980657188  |z (OCoLC)981048666  |z (OCoLC)981140376  |z (OCoLC)988383295  |z (OCoLC)993674969 
050 4 |a QC793.5.E62 
072 7 |a SCI  |x 021000  |2 bisacsh 
072 7 |a SCI  |x 022000  |2 bisacsh 
082 0 4 |a 621.367  |2 23 
049 |a TEFA 
245 0 0 |a Advances in imaging and electron physics.  |n Volume 200 /  |c edited by Peter W. Hawkes. 
264 1 |a Amsterdam :  |b Academic Press,  |c 2017. 
300 |a 1 online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Advances in Imaging and Electron Physics ;  |v Volume 200 
506 |a Owing to Legal Deposit regulations this resource may only be accessed from within National Library of Scotland. For more information contact enquiries@nls.uk.  |5 StEdNL 
588 0 |a CIP data; item not viewed. 
505 0 |a Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Contributors; Preface; Future Contributions; Chapter One: Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope; 1. The Limits of Resolving Power and the Sources of Aberrations; 1.1. The First Estimate of the Resolution Limit and the Resolution Achieved at the Present Time; 1.2. Sources of Errors Which Have to Be Diminished in Order to Attain the Resolution Limit. 
505 8 |a 1.3. Resolution Limit due to the Combination of Diffraction and Spherical Aberration in the Objective for Two Image Point ... 1.4. Nature and Magnitude of Permissible Disturbances If the Resolution Limit for Two Points Radiating Incoherently Is to ... ; 1.5. Resolution Limit of Linear Lattices, in Partially Coherent Illumination, due to Spherical and Chromatic Aberrations ... ; 1.6. Zone Plates for Improving Resolution and Contrast in Bright- and Dark-Field Images; 2. The Single-Field Condenser Objective; 2.1. Principle, Ray Paths, and Construction. 
505 8 |a 2.2. Electron Beam Energy and Resolution Limit for Two Incoherently Radiating Points2.3. Nature and Magnitude of Permissible Disturbances If the Resolution Limit for Two Points Radiating Incoherently Is to ... ; 2.4. Resolution Limit for Linear Lattices, in Partially Coherent Illumination, When the Disturbances Are so Small That Th ... ; 3. Movement of the Image During Photographic Exposure; 3.1. Movement and Heating of the Specimen; 3.2. Movement of the Electron Image due to Electric and Magnetic Fields; 4. Lack of Sharpness of the Image; 4.1. Instability in the Lenses. 
505 8 |a 4.2. Noncircularity of Lenses5. Changes in the Specimen; 5.1. Interaction Between Specimen, Electron Beam, and Residual Gases; 5.2. Specimen-Space Cooling as a Means of Preventing Changes in the Specimen due to Residual Gas During Electron Irradiation; 5.3. Cooling of the Specimen as Well as Its Surroundings; 6. Self-Structure of Supporting Films; References; Chapter Two: Phase Plates for Transmission Electron Microscopy; 1. Introductory Survey; 2. Postspecimen Plates; 2.1. Geometry; 2.2. Methods of Controlling Phase Shift; 3. Theory for Postspecimen Plates; 3.1. Illumination Function. 
505 8 |a 3.2. Object Function3.2.1. Disc Object; 3.2.2. Spherical Object; 3.2.3. Object of Helical Phase; 3.3. Plate Function; 3.3.1. Two General Types of Plate-Intercepting and Phase Changing; 3.3.2. Zernike Plate Geometries; 3.3.2.1. Step Transition; 3.3.2.2. Linear Transition From q=0 to q=q0 (""Full Ramp""); 3.3.3. Foucault/Hilbert Plate; 4. Images With Zernike Plates; 4.1. Size Parameter; 4.2. A Rotationally Symmetric Object and a Zernike Plate; 4.3. A Disc Object and Zernike Plate; 4.3.1. Loss Function for Disc Object and Step Phase Change at q0; 4.3.2. A Disc Object With a Step Phase Change. 
520 |a Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 
650 0 |a Optoelectronic devices. 
650 0 |a Optical data processing. 
650 7 |a SCIENCE  |x Physics  |x Electricity.  |2 bisacsh 
650 7 |a SCIENCE  |x Physics  |x Electromagnetism.  |2 bisacsh 
650 7 |a Optical data processing.  |2 fast  |0 (OCoLC)fst01046675 
650 7 |a Optoelectronic devices.  |2 fast  |0 (OCoLC)fst01046908 
655 4 |a Electronic books. 
700 1 |a Hawkes, P. W.,  |e editor. 
776 0 8 |i Print version :  |z 9780128120903 
856 4 0 |u https://www.sciencedirect.com/science/bookseries/10765670/200  |z Full Text via HEAL-Link