Showing 1 - 1 results of 1 for search '"Integrated circuits Ultra large scale integration Reliability."', query time: 0.04s Refine Results
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    Terrestrial radiation effects in ULSI devices and electronic systems /
    by Ibe, Eishi H.
    Published 2015
    Subjects: “…Integrated circuits Ultra large scale integration Reliability.…”
    Full Text via HEAL-Link
    eBook
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