Helium Ion Microscopy Principles and Applications /

ανά Joy, David C.
Έκδοση 2013

Monte Carlo modeling for electron microscopy and microanalysis

ανά Joy, David C.
Έκδοση 1995

Scanning Electron Microscopy and X-Ray Microanalysis

ανά Goldstein, Joseph I., Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.
Έκδοση 2018