Jacob Savir

Jacob Savir is a professor in the Department of Electrical and Computer Engineering at the New Jersey Institute of Technology and an IEEE Fellow.

He is credited with developing two approaches to detecting Transition Faults (a type of Fault model) that might occur during the manufacturing of semiconductor chips, viz., the Skewed-Load Transition Test (Launch-off-shift at-speed test) and the Broad-side delay test (Launch on Capture at-speed test). Provided by Wikipedia