Monte Carlo modeling for electron microscopy and microanalysis

• Main Author: Joy, David C.
• Format: Book
• Language: English
• Published: New York Oxford University Press 1995
• Series: Oxford series in optical and imaging sciences 9
• Subjects: Ηλεκτρονικό μικροσκόπιο; Μέθοδος Monte Carlo
• Physical Description: viii, 216 p. fig., tab. 24 cm
• ISBN: 0195088743