Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems /
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Format: | Thesis Book |
| Language: | English |
| Subjects: | |
| Online Access: | http://hdl.handle.net/10889/10909 |
Internet
http://hdl.handle.net/10889/10909ΒΚΠ - Πατρα: RES
| Call Number: |
005.746 ΣΙΣ |
|---|---|
| Copy 1 | Available |