Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems /
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| Format: | Thesis Book |
| Language: | English |
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| Online Access: | http://hdl.handle.net/10889/10909 |
| Physical Description: | 171 σ. : εικ. ; 30 εκ. |
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| Bibliography: | Περιλαμβάνει βιβλιογραφικές παραπομπές. |