Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash :
SPIE,
c2005.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering
5657 SPIE proceedings series 5657 |
| Subjects: |
| Item Description: | Περιλαμβάνει βιβλιογραφικές παραπομπές and ευρετήριο. |
|---|---|
| Physical Description: | viii, 128 σ. : εικ., χάρτες ; 28 εκ. |
| ISBN: | 0819456187 |
| ISSN: | 0277-786X ; |