Applied logistic regression solutions manual to accompany

Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley, Cook, Elizabeth Donohoe
Format: Book
Language:English
Published: New York John Wiley & Sons 2001
Edition:2nd ed.
Series:Wiley series in probability and statistics
Subjects:

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 519.536 HOS
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