Fundamentals of Nanoscale Film Analysis

• Κύριος συγγραφέας: Alford, Terry L.
• Άλλοι συγγραφείς: Feldman, Leonard C., Mayer, James W., 1930-
• Μορφή: Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA Springer Science+Business Media, Inc. 2007
• Θέματα: Surfaces (Physics); Nanotechnology; Particles (Nuclear physics); Condensed matter; Electronics; Chemistry; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Solid State Physics and Spectroscopy; Condensed Matter; Electronics and Microelectronics, Instrumentation