Alford, T. L., Feldman, L. C., & Mayer, J. W. (2007). Fundamentals of Nanoscale Film Analysis. Springer Science+Business Media, Inc.
Chicago Style (17th ed.) CitationAlford, Terry L., Leonard C. Feldman, and James W. Mayer. Fundamentals of Nanoscale Film Analysis. Boston, MA: Springer Science+Business Media, Inc, 2007.
MLA (8th ed.) CitationAlford, Terry L., et al. Fundamentals of Nanoscale Film Analysis. Springer Science+Business Media, Inc, 2007.
Warning: These citations may not always be 100% accurate.