|
|
|
|
| LEADER |
01428nom a2200385 u 4500 |
| 001 |
10069523 |
| 003 |
upatras |
| 005 |
20210117201543.0 |
| 008 |
090512s2007 eng |
| 020 |
|
|
|a 9780387292618
|
| 040 |
|
|
|a GR-PaULI
|c GR-PaULI
|
| 041 |
0 |
|
|a eng
|
| 100 |
1 |
|
|a Alford, Terry L.
|9 64427
|
| 245 |
1 |
0 |
|a Fundamentals of Nanoscale Film Analysis
|h [electronic resource]
|c by Terry L. Alford, Leonard C. Feldman, James W. Mayer
|
| 260 |
|
|
|a Boston, MA
|b Springer Science+Business Media, Inc.
|c 2007
|
| 300 |
|
|
|b v.: digital
|
| 650 |
|
4 |
|a Surfaces (Physics)
|9 64420
|
| 650 |
|
4 |
|a Nanotechnology
|9 19191
|
| 650 |
|
4 |
|a Particles (Nuclear physics)
|9 19607
|
| 650 |
|
4 |
|a Condensed matter
|9 64428
|
| 650 |
|
4 |
|a Electronics
|9 15695
|
| 650 |
|
4 |
|a Chemistry
|9 11013
|
| 650 |
|
4 |
|a Characterization and Evaluation of Materials
|9 64421
|
| 650 |
|
4 |
|a Surfaces and Interfaces, Thin Films
|9 64422
|
| 650 |
|
4 |
|a Nanotechnology
|9 19191
|
| 650 |
|
4 |
|a Solid State Physics and Spectroscopy
|9 64425
|
| 650 |
|
4 |
|a Condensed Matter
|9 64429
|
| 650 |
|
4 |
|a Electronics and Microelectronics, Instrumentation
|9 64430
|
| 700 |
1 |
|
|a Feldman, Leonard C.
|9 64431
|
| 700 |
1 |
|
|9 64432
|a Mayer, James W.,
|d 1930-
|
| 852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΒΚΠ
|
| 856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-0-387-29261-8
|
| 942 |
|
|
|2 ddc
|
| 952 |
|
|
|0 0
|1 0
|4 0
|7 0
|9 70968
|a LISP
|b LISP
|d 2016-04-24
|l 0
|r 2016-04-24 00:00:00
|w 2016-04-24
|y ERS
|
| 999 |
|
|
|c 45769
|d 45769
|
