Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Alford, Terry L.
Άλλοι συγγραφείς:	Feldman, Leonard C., Mayer, James W., 1930-
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer Science+Business Media, Inc. 2007
Θέματα:	Surfaces (Physics) Nanotechnology Particles (Nuclear physics) Condensed matter Electronics Chemistry Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Solid State Physics and Spectroscopy Condensed Matter Electronics and Microelectronics, Instrumentation
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-0-387-29261-8

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