Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis

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Bibliographic Details
Main Author:	Alford, Terry L.
Other Authors:	Feldman, Leonard C., Mayer, James W., 1930-
Format:	Electronic Kit Book
Language:	English
Published:	Boston, MA Springer Science+Business Media, Inc. 2007
Subjects:	Surfaces (Physics) Nanotechnology Particles (Nuclear physics) Condensed matter Electronics Chemistry Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Solid State Physics and Spectroscopy Condensed Matter Electronics and Microelectronics, Instrumentation
Online Access:	http://dx.doi.org/10.1007/978-0-387-29261-8

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