Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

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Bibliographic Details
Main Author: Egerton, Ray F.
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media, Inc. 2005
Subjects:
Materials
Μικροσκόπια
Chemistry
Characterization and Evaluation Materials
Biological Microscopy
Online Access:http://dx.doi.org/10.1007/b136495

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