Data Mining and Diagnosing IC Fails

• Main Author: Huisman, Leendert M.
• Format: Electronic Kit Book
• Language: English
• Published: Boston, MA Springer Science+Business Media, Inc. 2005
• Series: Frontiers in Electronic Testing 31
• Subjects: Engineering; Electronics; Systems engineering; Electronics and Microelectronics, Instrumentation; Circuits and Systems
• Physical Description: v.: digital
• ISBN: 9780387263519
• ISSN: 0929-1296