Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Foster, Adam
Άλλοι συγγραφείς:	Hofer, Werner
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	New York, NY Springer Science+Business Media, LLC 2006
Σειρά:	NanoScience and Technology
Θέματα:	Nanotechnology Materials Surfaces (Physics) Μικροσκόπια Μοριακή δομή Particles (Nuclear physics) Chemistry Characterization and Evaluation Materials Surfaces and Interfaces, Thin Films Biological Microscopy Atomic and Molecular Structure and Spectra Solid State Physics and Spectroscopy
Διαθέσιμο Online:	http://dx.doi.org/10.1007/0-387-37231-8

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