Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

• Main Author: Foster, Adam
• Other Authors: Hofer, Werner
• Format: Electronic Kit Book
• Language: English
• Published: New York, NY Springer Science+Business Media, LLC 2006
• Series: NanoScience and Technology
• Subjects: Nanotechnology; Materials; Surfaces (Physics); Μικροσκόπια; Μοριακή δομή; Particles (Nuclear physics); Chemistry; Characterization and Evaluation Materials; Surfaces and Interfaces, Thin Films; Biological Microscopy; Atomic and Molecular Structure and Spectra; Solid State Physics and Spectroscopy