Kaupp, G. (2006). Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Springer-Verlag Berlin Heidelberg.
Chicago Style (17th ed.) CitationKaupp, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2006.
MLA (8th ed.) CitationKaupp, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Springer-Verlag Berlin Heidelberg, 2006.
Warning: These citations may not always be 100% accurate.