Abstraction Refinement for Large Scale Model Checking
Main Author: | Wang, Chao |
---|---|
Other Authors: | Hachtel, Gary D., Somenzi, Fabio |
Format: | Electronic Kit Book |
Language: | English |
Published: |
Boston, MA
Springer Science+Business Media, LLC
2006
|
Series: | Series on Integrated Circuits and Systems
|
Subjects: | |
Online Access: | http://dx.doi.org/10.1007/0-387-34600-7 |
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