Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations

Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Garg, Rajesh
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Khatri, Sunil P
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer-Verlag US 2010
Θέματα:	Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-1-4419-0931-2

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